Test access port with address and command capability

ABSTRACT

The disclosure provides a novel method and apparatus for inputting addresses to devices to select the device TAP for access. Further, the disclosure provides a novel method and apparatus for inputting addresses for selecting device TAPs and for inputting commands for commanding circuitry within the device. The inputting of addresses or the inputting of addresses and commands is initiated by a control bit input on TDI that is recognized during the Run Test/Idle, Pause-DR or Pause-IR TAP states.

This application is a divisional of prior application Ser. No.14/934,437, filed Nov. 6, 2015, currently pending;

Which was a divisional of prior application Ser. No. 14/605,728, filedJan. 26, 2015, now U.S. Pat. No. 9,213,062, granted Dec. 15, 2015;

Which was a divisional of prior application Ser. No. 13/953,250, filedJul. 29, 2013, now U.S. Pat. No. 8,984,358, granted Mar. 17, 2015;

Which was a divisional of prior application Ser. No. 13/614,615, filedSep. 13, 2012; now U.S. Pat. No. 8,522,095, granted Aug. 27, 2013;

Which was a divisional of prior application Ser. No. 13/427,270, filedMar. 22, 2012, now abandoned;

Which was a divisional of prior application Ser. No. 12/970,097, filedDec. 16, 2010, now U.S. Pat. No. 8,166,358, granted Apr. 24, 2012;

Which was a divisional of prior application Ser. No. 12/116,496, filedMay 7, 2008, now U.S. Pat. No. 7,877,653, granted Jan. 25, 2011;

And claims priority under 35 USC 119(e)(1) of Provisional ApplicationNo. 60/917,002, filed May 9, 2007.

FIELD OF THE DISCLOSURE

This disclosure relates in general to devices using Test Access Portsand in particular to devices using Test Access Ports that can beaddressed and commanded.

DESCRIPTION OF RELATED ART

Most electrical devices today, which may be boards, ICs or embeddedcores within ICs, use the IEEE 1149.1 standard TAP and interface(referred to hereafter as JTAG TAP interface) to perform a variety ofnecessary operations, including but not limited to hardware testoperations, hardware diagnostic operations, hardware/software debugoperations, software trace operations and hardware programmingoperations. A number of additional IEEE standards have been created thatalso utilize the JTAG TAP interface to perform standardized operationsbeyond what the original JTAG TAP standard was designed to perform. Someof these additional IEEE standards include 1149.4, 1149.6, 1149.7, 1532,1581, 1687, and 1500. The JTAG TAP interface of a device includes a testdata input (TDI) terminal, a test clock (TCK) terminal, a test modeselect (TMS) terminal, a test data output (TDO) terminal, and optionallya test reset (TRST) terminal. These device TAP interface terminals arededicated and thus are available for enabling the above mentioned deviceoperations at any point in the device's lifetime, i.e. devicemanufacturing through device system application.

FIG. 1 illustrates an 1149.1 TAP controller interfaced to a device's1149.1 TAP via TDI, TCK, TMS, and TDO signals to allow the TAPcontroller to access the device TAP's instruction register (IR) and dataregisters (DR). An optional TRST signal may be used if desired betweenthe TAP controller and device TAP for resetting the TAP. However, forsimplification the optional TRST signal is not shown between the TAPcontroller and device TAP. This interface configuration is well known.

FIG. 2 illustrates the state diagram of the IEEE standard 1149.1 TAP. Asseen, the logic level on the TMS signal, during each rising edge of TCK,causes transitions in the state diagram. This state diagram is wellknown.

FIG. 3 illustrates a TAP controller interfaced to a number of deviceTAPs configured into a Daisy-Chain arrangement. This interfaceconfiguration is well known.

FIG. 4 illustrates a TAP controller interfaced to a number of deviceTAPs configured in a Star arrangement. As seen, this interface uses aunique TMS signal from the TAP controller to enable access of eachdevice TAP. Having a unique TMS signal for each device TAP increases thewiring between the TAP controller and device TAPs. This interfaceconfiguration is well known.

FIG. 5 illustrates a TAP controller interfaced to a number of deviceTAPs configured in a Star arrangement. As seen, this interface uses aunique TCK signal from the TAP controller to enable access of eachdevice TAP. Having a unique TCK signal for each device TAP increases thewiring between the TAP controller and device TAPs. This interfaceconfiguration is well known.

FIG. 6 illustrates device TAP state transition sequences 602-610. TheseTAP state sequences are provided to illustrate the value of the TDIinput to the device TAP. These state transitions are defined by the TAPstate diagram of FIG. 2. The rising and falling edges of TCK 600 areshown above the TAP state transitions 602-610.

In sequence 602 the device TAP is seen transitioning from the Test LogicReset state to the Run Test/Idle state then to the Select-DR state. Asseen, the device TAP will remain in the Run Test/Idle state if the TMSinput is held at a logic zero. Since data is not input during thesestate transitions, the value of the TDI input to the device is a don'tcare (X).

In sequence 604 the device TAP is seen transitioning from the Update-DRstate to the Run Test/Idle state then to the Select-DR state. As seen,the device TAP will remain in the Run Test/Idle state if the TMS inputis held at a logic zero. Since data is not input during these statetransitions, the value of the TDI input to the device is a don't care(X).

In sequence 606 the device TAP is seen transitioning from the Update-IRstate to the Run Test/Idle state then to the Select-DR state. As seen,the device TAP will remain in the Run Test/Idle state if the TMS inputis held at a logic zero. Since data is not input during these statetransitions, the value of the TDI input to the device is a don't care(X).

In sequence 608 the device TAP is seen transitioning from the Exit1-DRstate to the Pause-DR state then to the Exit2-DR state. The statepreceding the Exit1-DR state is the Shift-DR state (see FIG. 2) and inthe Shift-DR state TDI is set to the last data bit value (D) to beshifted into the TAP's selected data register. As seen, the device TAPwill remain in the Pause-DR state if the TMS input is held at a logiczero. Since data is not input during these state transitions, the valueof the TDI input to the device is a don't care (X).

In sequence 610 the device TAP is seen transitioning from the Exit1-IRstate to the Pause-IR state then to the Exit2-IR state. The statepreceding the Exit1-IR state is the Shift-IR state (see FIG. 2) and inthe Shift-IR state TDI is set to the last data bit value (D) to beshifted into the TAP's instruction register. As seen, the device TAPwill remain in the Pause-IR state if the TMS input is held at a logiczero. Since data is not input during these state transitions, the valueof the TDI input to the device is a don't care (X).

SUMMARY OF THE DISCLOSURE

This disclosure provides a novel method and apparatus for using acontrol bit on TDI upon entry into Run Test/Idle, Pause-DR or Pause-IRto allow inputting an address or inputting an address and a command to adevice via TDI. The address is used for selecting the device's TAP foraccess and the command is used for commanding an operation within thedevice. The device may be a board of ICs, an IC, or an embedded corewithin an IC.

DESCRIPTION OF THE VIEWS OF THE DISCLOSURE

FIG. 1 illustrates a 1149.1 TAP controller connected to a 1149.1 TAPs oftwo devices.

FIG. 2 illustrates the state diagram of an 1149.1 TAP state machine.

FIG. 3 illustrates a daisy-chain connection between a 1149.1 TAPcontroller and two devices with 1149.1 TAPs.

FIG. 4 illustrates a first star connection between an 1149.1 TAPcontroller and two devices with 1149.1 TAPs.

FIG. 5 illustrates a second star connection between an 1149.1 TAPcontroller and two devices with 1149.1 TAPs.

FIG. 6 illustrate 1149.1 TAP state transition examples.

FIG. 7 illustrates TAP state transition examples using TDI controlsignals according to the disclosure.

FIG. 8 illustrates a TAP controller connected to two device usingAddressable TAPs (ATAP) according to the disclosure.

FIG. 9 illustrates an example ATAP circuit.

FIG. 10 illustrates an example implementation of a TAP State Monitorcircuit used in an ATAP.

FIG. 11 illustrates an example implementation of State Decode circuitryused in an ATAP.

FIG. 12 illustrates an example implementation of an Address Circuit usedin an ATAP.

FIG. 13 illustrates an example implementation of an Address Controllercircuit used in the Address Circuit of FIG. 12.

FIG. 14A illustrates an example implementation of an Address DetectCircuit used in the Address Circuit of FIG. 12.

FIGS. 14B and 14C illustrate an example implementation of a TDOcontrolling Address Detect Circuit used in the Address Circuit of FIG.12.

FIG. 15 illustrates an example implementation of a first type of addresscomparator circuit used in the Address Detect Circuit of FIG. 14.

FIG. 16 illustrates an example implementation of a second type ofaddress comparator circuit used in the Address Detect Circuit of FIG.14.

FIG. 17 illustrates a first example of inputting an address during theRun Test/Idle state.

FIG. 18 illustrates a second example of inputting an address during theRun Test/Idle state.

FIG. 19 illustrates a third example of inputting an address during theRun Test/Idle state.

FIG. 20 illustrates an example of inputting an address during thePause-DR state.

FIG. 21 illustrates an example of inputting an address during thePause-IR state.

FIG. 22 illustrates a first example of not inputting an address duringthe Run Test/Idle state.

FIG. 23 illustrates a second example of not inputting an address duringthe Run Test/Idle state.

FIG. 24 illustrates an example of not inputting an address during thePause-DR state.

FIG. 25 illustrates an example of not inputting an address during thePause-IR state.

FIG. 26 illustrates a connection between an 1149.7 TAP controller andtwo devices with 1149.7 TAPs.

FIG. 27 illustrates a connection between an 1149.7 TAP controller and adevice with an 1149.7 TAP.

FIG. 28 illustrates example timing of transferring TDI, TMS and TDOsignals between an 1149.7 TAP controller and a device with an 1149.7TAP.

FIG. 29 illustrates an example implementation of an 1149.7 TAPinterface.

FIG. 30 illustrates an 1149.7 TAP interface including ATAP circuitry.

FIG. 31 illustrates an example Address & Command circuit for use in anATAP.

FIG. 32 illustrates an example Address Detect & Command Circuit for usein the Address & Command circuit of FIG. 31.

FIG. 33 illustrates an example implementation of a Command Register foruse in the Address Detect & Command Circuit of FIG. 32.

FIG. 34 illustrates a first example implementation of an Addressable &Commandable TAP.

FIG. 35 illustrates a second example implementation of an Addressable &Commandable TAP.

FIG. 36 illustrates a first example of inputting an address and acommand during the Run Test/Idle state.

FIG. 37 illustrates a second example of inputting an address and commandduring the Run Test/Idle state.

FIG. 38 illustrates an example of inputting an address and commandduring the Pause-DR or Pause-IR states.

FIG. 39 illustrates a device including an Addressable & Commandable TAPinterfaced to a TAP Linking Circuit for selectively accessing pluralTAPs.

FIG. 40 illustrates an example implementation of the TAP Linking Circuitof FIG. 39.

FIG. 41 illustrates an alternative example implementation of how toselect or deselect a TAP using a gated TCK signal instead of a gated TMSsignal.

DETAILED DESCRIPTION

FIG. 7 illustrates device TAP state transition sequences 702-710. Thestate sequences 702-710 are similar to state sequence 602-610 of FIG. 6with the exception that they have been modified, as will be describedbelow, to enable the TAP addressing capabilities of the presentdisclosure. These TAP state sequences 702-710 illustrate how the presentdisclosure modifies the TDI input to the device TAPs during the statetransitions to enable TDI to be used to input an address to select ordeselect a device TAP. The rising and falling edges of TCK 700 are shownabove the TAP state transitions 702-710.

In sequence 702 the device TAP is seen transitioning from the Test LogicReset state to the Run Test/Idle state then to the Select-DR state. Asseen, the device TAP will remain in the Run Test/Idle state if the TMSinput is held at a logic zero. As seen and according to the presentdisclosure, the value of TDI upon entry to the Run Test/Idle state is nolonger a don't care (X) signal as in sequence 602, but rather is definedas a control (C) signal. The control (C) signal is used to indicatewhether data (D) or don't care (X) values are input to the device onsubsequent TDI inputs during the Run Test/Idle state. If the control (C)signal is set low, TDI inputs don't care (X) values during the RunTest/Idle state as shown in sequence 602. However, if the control (C)signal is set high, TDI inputs data (D) values during the Run Test/Idlestate as shown in sequence 702. The TDI data (D) values input during theRun Test/Idle state are used to input an address to addressing circuitrywithin the device to either select or deselect the device's TAP. Theaddressing circuitry of the present disclosure will be described later.

In sequence 704 the device TAP is seen transitioning from the Update-DRstate to the Run Test/Idle state then to the Select-DR state. As seen,the device TAP will remain in the Run Test/Idle state if the TMS inputis held at a logic zero. As mentioned in sequence 702, the value of TDIupon entry to the Run Test/Idle state is defined to be a control (C)signal that indicates whether address data (D) or don't care (X) valuesare input to the device on subsequent TDI inputs during the RunTest/Idle state. Also as mentioned in sequence 702, TDI data (D) valuesinput during the Run Test/Idle state are used to input an address toaddressing circuitry within the device to either select or deselect thedevice's TAP.

In sequence 706 the device TAP is seen transitioning from the Update-IRstate to the Run Test/Idle state then to the Select-DR state. As seen,the device TAP will remain in the Run Test/Idle state if the TMS inputis held at a logic zero. As mentioned in sequence 702, the value of TDIupon entry to the Run Test/Idle state is defined to be a control (C)signal that indicates whether address data (D) or don't care (X) valuesare input to the device on subsequent TDI inputs during the RunTest/Idle state. Also as mentioned in sequence 702, TDI data (D) valuesinput during the Run Test/Idle state are used to input an address toaddressing circuitry within the device to either select or deselect thedevice's TAP.

In sequence 708 the device TAP is seen transitioning from the Exit1-DRstate to the Pause-DR state then to the Exit2-DR state. As seen, thedevice TAP will remain in the Pause-DR state if the TMS input is held ata logic zero. The value of TDI upon entry to the Pause-DR state isdefined to be a control (C) signal that indicates whether address data(D) or don't care (X) values are input to the device on subsequent TDIinputs during the Pause-DR state. If the control (C) signal is set low,TDI inputs don't care (X) values during the Pause-DR state as shown insequence 608. However, if the control (C) signal is set high, TDI inputsdata (D) values during the Pause-DR state as shown in sequence 708. TheTDI data (D) values input during the Pause-DR state are used to input anaddress to addressing circuitry within the device to either select ordeselect the device's TAP.

In sequence 710 the device TAP is seen transitioning from the Exit1-IRstate to the Pause-IR state then to the Exit2-IR state. As seen, thedevice TAP will remain in the Pause-IR state if the TMS input is held ata logic zero. The value of TDI upon entry to the Pause-IR state isdefined to be a control (C) signal that indicates whether address data(D) or don't care (X) values are input to the device on subsequent TDIinputs during the Pause-IR state. If the control (C) signal is set low,TDI inputs don't care (X) values during the Pause-DR state as shown insequence 610. However, if the control (C) signal is set high, TDI inputsdata (D) values during the Pause-IR state as shown in sequence 710. TheTDI data (D) values input during the Pause-IR state are used to input anaddress to addressing circuitry within the device to either select ordeselect the device's TAP.

It should be understood that the above mentioned control (C) signallogic levels could be reversed if desired to where a logic low on thecontrol (C) signal indicates the input of data (D) values on TDI and alogic high on the control (C) signal indicates the input of don't care(X) values on TDI during the Run Test/Idle, Pause-DR, and Pause-IRstates. This is true for other signals in this disclosure where signallogic levels are mentioned.

FIG. 8 illustrates the addressable device TAP arrangement 800 of thepresent disclosure. As seen, a TAP controller 801, adapted foraddressing device TAPs according to the present disclosure, is coupledto addressable TAPs (ATAP) 802 of devices 1-N via TDI, TCK, TMS, and TDOsignal wires. Using ATAPs 802 in the devices, each device may beselected for communicating with the TAP controller or be deselected fromcommunicating with the TAP controller using the TAP state sequences702-710 of FIG. 7. As seen, the number of signal wires between the TAPcontroller and device ATAPs is only four, or five if the optional TRSTsignal is used. The addressable TAP arrangement of FIG. 8 is similar inoperation to the Star arrangements of FIGS. 4 and 5 in that each devicemay be accessed independent of the other devices. The advantage FIG. 8has over the Star arrangements of FIGS. 4 and 5 is that it only requiresa TDI, TCK, TMS, TDO interface between the TAP controller and thedevices. For example, the Star arrangement of FIG. 4 requires the TDI,TCK, and TDO signals plus a unique TMS for each device. Similarly, Stararrangement of FIG. 5 requires the TDI, TMS, and TDO signal plus aunique TCK for each device. The interface wiring for 20 devices in FIG.8 requires only four wires for the TDI, TCK, TMS, and TDO signals. Theinterface wiring for 20 devices in FIG. 4 requires three wires for TDI,TCK, and TDO plus 20 wires for the unique TMS signals. The interfacewiring for 20 devices in FIG. 5 requires three wires for TDI, TMS, andTDO plus 20 wires for the unique TCK signals.

FIG. 9 illustrates an example implementation of the ATAP 802 of FIG. 8according to the present disclosure. The ATAP 802 includes a TAP StateMonitor 902, And gate 904, Address Circuit 906, TAP State Decode circuit908, 1149.1 TAP state machine 910, and Power Up Reset (PUR) circuit 912,all connected as shown. In comparison, the 1149.1 TAPs shown in FIGS. 1,3, 4, 5, only contain the 1149.1 TAP state machine 910 and possibly aPUR circuit 912 to reset the 1149.1 TAP state machine 910. The controloutput of the 1149.1 TAP state machine 910 controls instruction and dataregister (IR and DR) shift operations as shown in FIG. 1. The TAP StateMonitor 902, And gate 904, Address Circuit 906, and TAP state decodecircuit 908 are added to the 1149.1 TAP state machine 910 to form theATAP. The PUR circuit 912 serves to reset the TAP State Monitor circuitwhen the device first powers up by pulsing the TRST input of the TAPState Monitor low. The TAP State Monitor is a state machine thatoperates according to the state diagram of FIG. 2. When the TAP StateMonitor resets it goes to the Test Logic Reset state of FIG. 2 where itoutputs a reset (RST) signal to the Address Circuit 906 and 1149.1 TAPstate machine 910 to reset them. The TAP State Monitor circuit can alsobe reset to the Test Logic Reset state of FIG. 2 by setting TMS high andinputting 5 TCKs, or by the optional TRST signal.

The And gate 904 serves to gate the TMS signal to the TMS' input of the1149.1 TAP 910 on and off in response to the Enable signal from theAddress Circuit 906. When gated on the 1149.1 TAP 910 receives the TMSsignal on its TMS' input and operates as shown in the state diagram ofFIG. 2. When gated off, the 1149.1 TAP 910 receives a low input on itsTMS' input and remains in the Run Test/Idle, Pause-DR, or Pause-IRstate. The Address Circuit 906 operates to input an address from TDIwhen the TAP State Monitor 902 is in the Run Test/Idle, Pause-DR, orPause-IR state if the TDI control (C) signal is set high, as describedand shown in sequences of FIG. 7. If the TDI control (C) signal is setlow, the Address Circuit does not input an address during these states,again as described and shown in the sequences of FIG. 7. The StateDecode circuit 908 serves to detect when the TAP State Monitor 902 is inthe Run Test/Idle, Pause-DR, or Pause-IR state and to output statedetection signals RTI (Run Test/Idle) and PSE (Pause-DR or Pause-IR) tothe Address Circuit when this occurs.

FIG. 10 illustrates an example implementation of the TAP State Monitor902. The TAP State Monitor 902 includes next state logic 1002, stateflip flops (FF) 1004, and RST Decode Circuitry 1006, all connected asshown. The RST Decode Circuitry sets the RST signal low when the TAPState Monitor is in the Test Logic Reset state. The TAP State Monitorresponds to the TCK and TMS inputs to transition through the states ofthe FIG. 2 state diagram. The next state logic 1002 operates to inputpresent state (A-D) signals from the FFs 1004 and the TMS signal and tooutput next state signals (NA-ND) to the FFs 1004 and State Decodecircuit 908.

FIG. 11 illustrates an example implementation of the State Decodecircuit 908 which includes And gates 1102 and 1104. And gate 1102detects when the next state (ND-NA) of the TAP State Monitor 902 iseither the Pause-DR (>3 in this example) state or the Pause-IR (>B inthis example) state and outputs a Pause-DR/IR (PSE) signal to theAddress Circuit 906. And gate 1104 detects when the next state (ND-NA)of the TAP State Monitor 902 is the Run Test/Idle (>C in this example)state and outputs a Run Test/Idle (RTI) signal to the Address Circuit906. In response to receiving a logic high on the control (C) signalfrom TDI and a logic high on either the PSE or RTI signals, the AddressCircuit 906 inputs an address from the TDI input.

FIG. 12 illustrates an example implementation of the Address Circuit906. The Address Circuit includes an Address Controller 1202, AddressDetect Circuit 1204, and Or gate 1206, all connected as shown. TheAddress Controller is timed by TCK to poll the states of the TDI inputand the PSE or RTI Signal (PRS) output from Or gate 1206. When TDI andPRS are both high, the Address Controller enables the CLK input to theAddress Detect Circuit. In response to the CLK, the Address DetectCircuit 1204 inputs a number of address bits from the TDI signal. Thenumber of address bits input to the Address Detect Circuit 1204 isdetermined by a counter within the Address Controller 1202. If theaddress shifted into the Address Detect Circuit 1204 matches an expectedaddress, the Enable output of the Address Detect circuit 1204 goes highin response to an Update signal from Address Controller 1202. WhenEnable is high, the TMS' input to the 1149.1 TAP state machine 910 isdriven by TMS via And gate 904 and the 1149.1 TAP state machine 910operates in lock step with the TAP State Monitor 902. After inputting anaddress the ATAP 802 may be transitioned out of the Run Test/Idle,Pause-IR or Pause-DR state.

FIG. 13 illustrates one example implementation for the AddressController 1202 along with its operational state diagram. As seen theAddress Controller 1202 comprises a state machine 1302, And gates 1304and 1305, and counter 1307, all connected as shown. The state machine1302 will be in an Idle state 1306 when a logic zero is detected on TDIor PRS, or when reset by the RST input from the TAP State Monitor 902.The counter 1307 is reset while the state machine 1302 is in the Idlestate 1306. The state machine 1302 will transition to the shift addressregister (Shift) state 1308 when a logic one is detected on TDI and PRS.In the Shift state 1308, the counter is enabled to count in response tothe TCK input. The state machine will remain in the Shift state 1308until the counter reaches a count complete (CC) state. During the Shiftstate 1308 the state machine enables And gate 1304 to pass the TCKsignal to the CLK output signal of And gate 1304. The CLK signal clocksthe Address Detect Circuit 1204 to input an address from TDI. The statemachine transitions to the Update state 1309 when the CC signal fromcounter 1307 goes high at the end of a count period. During the Updatestate 1309 the state machine enables And gate 1305 to pass the TCKsignal to the Update output signal of And gate 1305. The Update signalstores the result of a comparison between the shifted in address andanother address in the Address Detect Circuit 1204. The state machinetransitions from the Update state 1309 to the Idle state 1306 when alogic zero is detected on PRS.

FIG. 14 illustrates one example implementation for the Address DetectCircuit 1204 which comprises a Group 1 Address circuit 1402, Group 2Address circuit 1403, Local Address circuit 1404, Global Address circuit1406, address compare circuits 1408-1412, Address Register 1414, Or gate1416, and FF 1417, all connected as shown. The Group 1 Address 1402 isused to select a group of two or more devices whose ATAP 802 have beenplaced in either the Pause-DR or Pause-IR state, which is indicated byPSE being high. The value of the Group 1 Address is the same for allATAPs. The Group 2 Address 1403 is used to select a group of two or moredevices whose ATAP 802 have been placed in the Run Test/Idle state,which is indicated by RTI being high. The value of the Group 2 Addressis the same for all ATAPs. The Local Address 1404 is used to select anindividual device's ATAP 802 when the ATAP is placed in the RunTest/Idle, Pause-DR, or Pause-IR states. The value of the Local Addressis unique for each ATAP. The Global Address 1406 is used to select alldevice ATAPs 802 that have been placed in the Run Test/Idle, Pause-DR,and Pause-IR state. Before inputting the Global Address, all deviceATAPs should be placed in a common steady state, i.e. all in RunTest/Idle, all in Pause-DR, or all in Pause-IR. However the GlobalAddress will select all ATAPs even if the ATAPs are in separate RunTest/Idle, Pause-DR, or Pause-IR states. The value of the Global Addressis the same for all ATAPs.

When the CLK input is active, address data from TDI is shifted intoAddress Register 1414, which is a shift register. At the end of theshift operation, the address loaded into the Address Register 1414 iscompared against the Group 1, Group 2, Local, and Global Addresses usingthe address compare circuits 1408-1412. If the address in the AddressRegister matches the Global Address, compare circuit 1412 outputs a highto set the output of OR gate 1416 high. FF 1417 outputs the high on theEnable signal on the falling edge of the Update signal from AddressController 1202. If the address in the Address Register matches theLocal Address, compare circuit 1410 outputs a high to set the output ofOR gate 1416 high. FF 1417 outputs the high on the Enable signal on thefalling edge of the Update signal. If the address in the AddressRegister matches the Group 1 Address and the PSE signal is high, comparecircuit 1408 outputs a high to set the output of OR gate 1416 high. FF1417 outputs the high on the Enable signal on the falling edge of theUpdate signal. If the address in the Address Register matches the Group2 Address and the RTI signal is high, compare circuit 1409 outputs ahigh to set the output of OR gate 1416 high. FF 1417 outputs the high onthe Enable signal on the falling edge of the Update signal. If none ofthe addresses match the address in the Address Register 1404 the outputof OR gate 1416 is set low. FF 1417 outputs the low on the Enable signalon the falling edge of the Update signal. When the Enable output goeshigh as a result of an address match, the ATAP's 1149.1 TAP statemachine 910 is enabled in lock step with the TAP State Monitor 902 andresponds to TMS inputs to transition through the state diagram of FIG.2. FF 1417 maintains the high or low setting of the Enable output untilthe next time an address is input to the Address Detect Circuit 1204. Ifthe RST input goes low, the Address Register 1414 is reset and FF 1417is reset which sets the Enable signal low.

It should be understood that when an 1149.1 TAP 910 of an ATAP 802 isdeselected (Enable=0) in the Run Test/Idle, Pause-IR or Pause-DR state,it should only be selected again (Enable=1) in the state it wasdeselected in, i.e. Run Test/Idle, Pause-IR or Pause-DR state. Thisallows the TAP 910 and TAP State Monitor 902 to remain state synchronouswith each other.

FIG. 15 illustrates an example implementation of Address Comparecircuits 1408 and 1409 which comprise a comparator 1502 and And gate1504 connected as shown. For Address Compare circuit 1408, thecomparator inputs the Group 1 Address and the address in the AddressRegister 1414 and outputs the result of the compare to an input of Andgate 1504. For Address Compare circuit 1408, the other input of the Andgate 1504 is connected to the PSE signal from State Decode circuit 908.For Address Compare circuit 1409, the comparator inputs the Group 2Address and the address in the Address Register 1414 and outputs theresult of the compare to an input of And gate 1504. For Address Comparecircuit 1409, the other input of the And gate 1504 is connected to theRTI signal from State Decode circuit 908. If an address match occurs inAddress Compare circuit 1408 and the PSE signal is high, the output fromAnd gate 1504 to OR gate 1416 goes high, otherwise the output of Andgate 1504 is low. If an address match occurs in Address Compare circuit1409 and the RTI signal is high, the output from And gate 1504 to ORgate 1416 goes high, otherwise the output of And gate 1504 is low.

FIG. 16 illustrates an example implementation of Address Comparecircuits 1410 and 1412 which comprise a comparator 1602. For AddressCompare circuit 1410, the comparator inputs the Local Address and theaddress in the Address Register 1414 and outputs the result of thecompare to an input of OR gate 1416. For Address Compare circuit 1412,the comparator inputs the Global Address and the address in AddressRegister 1414 and outputs the result of the compare to an input of ORgate 1416. If a match is detected between the Local Address and theaddress in the Address Register 1414, the output of the OR gates fromAddress Compare circuit 1410 will be high, otherwise it will be low. Ifa match is detected between the Group Address and the address in theAddress Register 1414, the output of the OR gate from Address Comparecircuit 1412 will be high, otherwise it will be low.

FIG. 17 illustrates a timing example of inputting an address into theATAPs 802 of two devices during the transition from Test Logic Reset toRun Test/Idle to Select-DR states. During the Test Logic Reset state,both devices are reset and deselected (Enable=0). The state transitionsoccur on the rising edge of TCK 1702. The devices could be the devicesof FIG. 8. As seen the TDI control bit 1704 and PRS signal 1706 are sethigh upon entering Run Test/Idle, which initiates the address input andupdate process. The ATAP remains in the Run Test/Idle state 1708 for thenumber of CLK (TCK) inputs required to Shift in the address bits fromTDI at time 1710 and to Update the address compare results into FF 1417at time 1712. Device selection result 1722 illustrates an example wheredevice 1 is enabled for access and a device 2 remains disabled fromaccess. Device selection result 1724 illustrates an example where device2 is enabled for access and device 1 remains disabled from access.Device selection result 1726 illustrates where both device 1 and 2 areenabled for access.

It is assumed at this point and beyond that if more than one device isselected, for example the device selection result 1726, using the Group1, Group 2, or Global address, the access will only involve statetransitions in the state diagram of FIG. 2 that avoid entry into theShift-DR and Shift-IR states. This avoids TDO output conflicts betweendevices sharing a common TDO connection, since a device TDO output isenabled during the Shift-DR and Shift-IR state. However, if entry intothe Shift-DR or Shift-IR states are required, for example to allowinputting instruction or data to multiple selected devices at the sametime via TDI, the Address Detect Circuit 1204 of FIG. 14 can beimplemented differently as shown in FIG. 14A to disable the device TDOoutput buffer 1420 whenever a match is detected between the addressshifted in and the Group 1, Group 2, or Global addresses. As seen an ORgate 1422 and FF 1424 are added to detect and latch a TDO Disable signal1428 whenever a Group 1, Group 2, or Global address is input andupdated. The TDO Disable signal 1426 overrides any other TDO enablesignal, via gating 1426, to insure that the TDO output buffer 1420 isdisabled while Group 1, Group 2, and Global addresses are in effect.

FIG. 18 illustrates a timing example of inputting an address into theATAPs 802 of two devices during the transition from Update-DR to RunTest/Idle to Select-DR states. The state transitions occur on the risingedge of TCK 1702. The devices could be the devices of FIG. 8. As seenthe TDI control bit 1704 and PRS signal 1706 are set high upon enteringRun Test/Idle, which initiates the address input and update process. TheATAP remains in the Run Test/Idle state 1708 for the number of CLK (TCK)inputs required to Shift in the address bits from TDI at time 1710 andto Update the address compare results into FF 1417 at time 1712. Deviceselection result 1802 illustrates an example where device 1 is enabledfor access and a device 2 remains disabled from access. Device selectionresult 1804 illustrates an example where device 1 is disabled fromaccess and device 2 remains disabled from access. Device selectionresult 1806 illustrates where device 1 is disabled from access anddevice 2 is enabled for access. Device selection result 1808 illustrateswhere both devices are enabled for access. Device selection result 1810illustrates where both devices are disabled from access.

FIG. 19 illustrates a timing example of inputting an address into theATAPs 802 of two devices during the transition from Update-IR to RunTest/Idle to Select-DR states. The state transitions occur on the risingedge of TCK 1702. The devices could be the devices of FIG. 8. As seenthe TDI control bit 1704 and PRS signal 1706 are set high upon enteringRun Test/Idle, which initiates the address input and update process. TheATAP remains in the Run Test/Idle state 1708 for the number of CLK (TCK)inputs required to Shift in the address bits from TDI at time 1710 andto Update the address compare results into FF 1417 at time 1712. Deviceselection result 1902 illustrates an example where device 1 is enabledfor access and a device 2 remains disabled from access. Device selectionresult 1904 illustrates an example where device 1 is disabled fromaccess and device 2 remains disabled from access. Device selectionresult 1906 illustrates where device 1 is disabled from access anddevice 2 is enabled for access. Device selection result 1908 illustrateswhere both devices are enabled for access. Device selection result 1910illustrates where both devices are disabled from access.

FIG. 20 illustrates a timing example of inputting an address into theATAPs 802 of two devices during the transition from Exit1-DR to Pause-DRto Exit2-DR states. The state transitions occur on the rising edge ofTCK 1702. The devices could be the devices of FIG. 8. As seen the TDIcontrol bit 1704 and PRS signal 1706 are set high upon enteringPause-DR, which initiates the address input and update process. The ATAPremains in the Pause-DR state 2001 for the number of CLK (TCK) inputsrequired to Shift in the address bits from TDI at time 1710 and toUpdate the address compare results into FF 1417 at time 1712. Deviceselection result 2002 illustrates an example where device 1 is enabledfor access and a device 2 remains disabled from access. Device selectionresult 2004 illustrates an example where device 1 is disabled fromaccess and device 2 remains disabled from access. Device selectionresult 2006 illustrates where device 1 is disabled from access anddevice 2 is enabled for access. Device selection result 2008 illustrateswhere both devices are enabled for access. Device selection result 2010illustrates where both devices are disabled from access.

FIG. 21 illustrates a timing example of inputting an address into theATAPs 802 of two devices during the transition from Exit1-IR to Pause-IRto Exit2-IR states. The state transitions occur on the rising edge ofTCK 1702. The devices could be the devices of FIG. 8. As seen the TDIcontrol bit 1704 and PRS signal 1706 are set high upon enteringPause-IR, which initiates the address input and update process. The ATAPremains in the Pause-IR state 2101 for the number of CLK (TCK) inputsrequired to Shift in the address bits from TDI at time 1710 and toUpdate the address compare results into FF 1417 at time 1712. Deviceselection result 2102 illustrates an example where device 1 is enabledfor access and a device 2 remains disabled from access. Device selectionresult 2104 illustrates an example where device 1 is disabled fromaccess and device 2 remains disabled from access. Device selectionresult 2106 illustrates where device 1 is disabled from access anddevice 2 is enabled for access. Device selection result 2108 illustrateswhere both devices are enabled for access. Device selection result 2110illustrates where both devices are disabled from access.

FIG. 22 illustrates a timing example of not inputting an address intothe ATAPs of two devices during the transition from the Test Logic Resetstate to the Run Test/Idle state to the Select-DR state. The transitionsoccur on the rising edge of TCK 1702. The devices could be the devicesof FIG. 8. As seen the TDI control bit 1704 is low upon entering the RunTest/Idle state, which prevents the address input and update process. Inthis example both devices remain disabled through the state transitions.

FIG. 23 illustrates a timing example of not inputting an address intothe ATAPs of two devices during the transition from the Update-DR/IR tothe Run Test/Idle state to the Select-DR state. The transitions occur onthe rising edge of TCK 1702. The devices could be the devices of FIG. 8.As seen the TDI control bit 1704 is low upon entering the Run Test/Idlestate, which prevents the address input and update process. In thisexample both devices remain in their present state through the statetransitions.

FIG. 24 illustrates a timing example of not inputting an address intothe ATAPs of two devices during the transition from the Exit1-DR stateto the Pause-DR state to the Exit2-DR state. The transitions occur onthe rising edge of TCK 1702. The devices could be the devices of FIG. 8.As seen the TDI control bit 1704 is low upon entering the Pause-DRstate, which prevents the address input and update process. In thisexample both devices remain in their present state through the statetransitions.

FIG. 25 illustrates a timing example of not inputting an address intothe ATAPs of two devices during the transition from the Exit1-IR stateto the Pause-IR state to the Exit2-IR state. The transitions occur onthe rising edge of TCK 1702. The devices could be the devices of FIG. 8.As seen the TDI control bit 1704 is low upon entering the Pause-IRstate, which prevents the address input and update process. In thisexample both devices remain in their present state through the statetransitions.

As can be seen from the timing examples of FIGS. 17-25, the state of theTDI control bit 1704 determines if an address input and address compareupdate operation occurs when the ATAP enters the Run Test/Idle,Pause-IR, or Pause-DR states.

FIG. 26 illustrates a 2 wire Star arrangement 2600 between an IEEE1149.7 TAP controller 2602 and devices 2604-2606 with IEEE 1149.7 TAPs2608. IEEE 1149.7 is a standard in development that can reduce thenumber of interconnects between a TAP controller and TAPs in devices toa minimum of only two, a TCK signal and a TMSC signal.

FIG. 27 illustrates a simplified view of the 1149.7 TAP 2608 accessing1149.1 instruction and data registers, shown in this example as acircuit block 2702, via a TDI input, control inputs, and a TDO output.

FIG. 28 illustrates one of the timing protocols 1149.7 uses to reducethe normal TDI, TCK, TMS, TDO four wire 1149.1 bus of FIG. 1 to only theTCK and TMSC two wire 1149.7 bus of FIGS. 26 and 27. As seen the 1149.7TAP controller (C) 2602 transmits TDI and TMS data to the 1149.7 device(D) TAP via the TMSC wire at times 2802 and 2804 respectively, then the1149.7 device (D) TAP transmits TDO data to the 1149.7 controller viathe TMSC wire at time 2806. The order of the TDI and TMS signalstransmitted may be reversed from that shown, i.e. TMS could betransmitted before TDI. This process of the 1149.7 TAP controllersending TDI and TMS data to the 1149.7 TAP over the TMSC wire followedby the 1149.7 TAP sending TDO data to the controller over the TMSC wirerepeats during the access.

FIG. 29 illustrates an example implementation of an 1149.7 TAP whichincludes an Adaptor circuit 2902, a standard 1149.1 TAP circuit 910, anda power up reset (PUR) circuit 2904. The Adaptor circuit 2902 receivesthe TDI and TMS signals serially from the controller 2602 via TMSC wireand outputs them as parallel TMS and TDI signals to the 1149.1 TAP 910and instruction and data registers, respectively, as shown in FIG. 1.After receiving the serial TDI and TMS signals, the Adaptor circuitreverses the direction of the TMSC wire and outputs the TDO signal fromthe 1149.1 TAP 910 to the controller 2602 via the TMSC wire. Theoperation of the Adaptor circuit 2902 is transparent to the 1149.1 TAP910 which responds to the TCK and TMS signals from the Adaptor toconventionally control TDI data input to and TDO data output from 1149.1instruction and data registers within the device.

Currently IEEE 1149.7 TAPs in the 2 wire Star arrangement of FIG. 26 canonly be addressed and selected for access by a 1149.7 TAP controllerwhile they are in the Run Test/Idle state. It would be beneficial toprovide a way to enhance 1149.7 TAPs so they are able to be addressedand selected for access in the Run Test/Idle, Pause-DR, and Pause-IRstates as described using the Group 1, Group 2, Local, and Globaladdresses of the present disclosure. The following descriptions show how1149.7 TAPs may be modified to include the addressing circuitry andmethods of this disclosure.

FIG. 30 illustrates an 1149.7 TAP 3002 that has been modified to includethe addressing circuits of the present disclosure. The modificationsinclude adding the Address Circuit 906, State Decode circuit 908, TAPState Monitor 902, PUR 912, and AND gate 904 to the Adaptor 2902 and1149.1 TAP 910 of FIG. 29. The arrangement and connections of theseadded circuits is similar to the arrangement and connection of thesecircuits shown added to the 1149.1 TAP 910 of FIG. 9. The AddressCircuit 906 receives the TDI and TCK signals from the Adaptor 2902 as itdid for the device TDI and TCK input leads of FIG. 9. The TAP StateMonitor 902 receives the TMS and TCK signals from the Adaptor 2902 as itdid for the device TMS and TCK input leads of FIG. 9. The TMS signalnormally connected between the Adaptor 2902 and 1149.1 TAP 910,according to the current state of the IEEE 1149.7 standard, is broken toinsert the AND gate 904 between the Adaptor's TMS output and 1149.1TAP's TMS' input, as the AND gate 904 was similarly inserted in the TMSsignal path of FIG. 9. The other input to the AND gate 910 is connectedto the Enable signal from the Address Circuit 906 as previouslydescribed in FIG. 9. The RST output from the TAP State Monitor 902 isconnected to the TRST input of the 1149.1 TAP 910 as previouslydescribed in FIG. 9. In this arrangement the TDI, TCK, and TMS signalsfrom the Adaptor operate the added addressing circuitry as previouslydescribed to enable and disable access to the 1149.1 TAP 910 in the RunTest/Idle, Pause-DR, and Pause-IR using the Group 1, Group 2, Local, andGlobal addresses.

While the present disclosure up to this point has described a method andapparatus for inputting an address for selecting a device TAP foraccess, it is not limited to only inputting of an address. The followingdescriptions and figures will illustrate how the disclosure can also beadvantageously be used to input a command as well.

FIG. 31 illustrates an Address & Command circuit 3102 that provides thepreviously described device TAP addressing feature plus the ability toalso input a command to the device. The Address & Command circuit 3102is the same as the Address circuit 906 of FIG. 12 with the exceptionthat the Address Detect & Command Circuit 3104 has replaced the AddressDetect Circuit 1204. The input and output signals of Address & Commandcircuit 3102 is the same as Address circuit 906 with the exception thatcircuit 3102 includes a command output bus 3108. The command bus 3108may be used to provide any type of commands to a device including, butnot limited to, commands used for device test purposes, commands usedfor device debug purposes, commands used for device trace purposes, andcommands used for device programming purposes.

FIG. 32 illustrates an example implementation of Address Detect &Command circuit 3104. As can be seen, Address Detect & Command circuit3104 is identical to Address Detect circuit 1204 of FIG. 14 with theexception that circuit 3104 includes a Command Register 3202 connectedin series with the Address Register 1414. The Command Register 3202 isconnected to; (1) the CLK signal from Address Controller 1202 to allowthe Command Register to shift when the Address Register shifts, (2) theEnable signal from FF 1417 to allow the command output bus 3108 ofCommand Register 3202 to be updated at the end of a shift operation, (3)the RST signal to allow the Command Register to be reset when theAddress Register is reset, and the Update signal from Address Controller1202 to update the Command Register output bus 3108 with a new command,if the Enable signal is high.

FIG. 33 illustrates an example implementation of Command Register 3202which consists of a Shift Register 3402 and Update Register 3404connected as shown. During the Shift state 1308 of FIG. 13 the ShiftRegister 3402 responds to the CLK signal to shift in (SI) data from ashift output lead of Address Register 1414. During the Update state 1309of FIG. 13 the Update Register 3404 updates its command output bus 3108in response to the Update signal input from Address Controller 1202, ifthe Enable input from FF 1417 is high or otherwise asserted. The commandoutput bus 3108 of Update Register 3404 is not updated in response tothe Update signal if the Enable input from FF 1417 is low or otherwisede-asserted. The Shift Registers parallel outputs may be coupleddirectly to the Update Registers parallel inputs, or the paralleloutputs and parallel inputs may be coupled via decode logic 3406. TheCommand Register 3202 is reset in response to the RST signal from TAPState Monitor 902. When reset, the Command Register's command output but3108 will be set to output a known command as specified by the devicedesigner.

The counter 1307 of FIG. 13 will provide a count length sufficient forshifting in and updating the address and command bits. The serialarrangement of the address register 1414 and command register 3202 couldbe reversed if desired such that the command register is placed ahead ofthe address register in the serial path.

FIG. 34 illustrates an Addressable & Commandable TAP (ACTAP) 3502. TheACTAP 3502 is identical with the ATAP 802 of FIG. 9, with the exceptionthat the Address Circuit 906 of FIG. 9 has been replace by the Address &Command Circuit 3102 of FIG. 31 and the command output bus 3108 from theAddress & Command Circuit 3102 is output from the ACTAP 3502. ACTAP 3502provides for addressing the 1149.1 TAP 910 for access and also providesa command bus for commanding circuits within the device containing ACTAP3502.

FIG. 35 illustrates an Addressable & Commandable TAP (ACTAP) 3602. TheACTAP 3602 is identical with the ATAP 3002 of FIG. 30, with theexception that the Address Circuit 906 of FIG. 30 has been replace bythe Address & Command Circuit 3102 of FIG. 31 and the command output bus3108 from the Address & Command Circuit 3102 is output from the ACTAP3602. ACTAP 3602 provides for addressing the 1149.1 TAP 910 for accessand also provides a command bus for commanding circuits within thedevice containing ACTAP 3602.

FIG. 36 illustrates a timing example of inputting an address and commandinto a device ACTAP 3502/3602 during the transition from Test LogicReset to Run Test/Idle to Select-DR states. During the Test Logic Resetstate the devices ACTAP was disabled by the RST signal and the commandbus 3108 was set to the Reset Command. The address input will select thedevice ACTAP for access. The state transitions occur on the rising edgeof TCK 1702. As seen the TDI control bit 1704 and PRS signal 1706 areset high upon entering Run Test/Idle, which initiates the address andcommand input and update process. The ACTAP remains in the Run Test/Idlestate 1708 for the number of CLK (TCK) inputs required to Shift in theaddress and command bits from the TDI input and Update the command bus3108. The falling edge 3702 of the last CLK input sets the Enable outputfrom FF 1417 high to enable the device ACTAP and the Update Register3404 of Command Register 3202. The rising edge 3704 of TCK provides theUpdate clock input to the Update Register 3404, via And gate 1305, toupdate the New Command shifted into the ACTAP onto command bus 3108.

FIG. 37 illustrates a timing example of inputting an address and commandinto a device ACTAP 3502/3602 during the transition from Update-DR/IR toRun Test/Idle to Select-DR states. The address input will select thedevice ACTAP for access if it was deselected or if the device ACTAP iscurrently selected, it will keep the device ACTAP selected. The statetransitions occur on the rising edge of TCK 1702. As seen the TDIcontrol bit 1704 and PRS signal 1706 are set high upon entering RunTest/Idle, which initiates the address and command input and updateprocess. The ACTAP remains in the Run Test/Idle state 1708 for thenumber of CLK (TCK) inputs required to Shift in the address and commandbits from the TDI input and Update the command bus 3108. The fallingedge 3702 of the last CLK input sets the Enable output from FF 1417 highto enable the device ACTAP and the Update Register 3404 of CommandRegister 3202. The rising edge 3704 of TCK provides the Update clockinput to the Update Register 3404, via And gate 1305, to update the NewCommand shifted into the ACTAP onto command bus 3108.

FIG. 38 illustrates a timing example of inputting an address and commandinto a device ACTAP 3502/3602 during the transition from Exit1-DR/IR toPause-DR/IR to Exit2-DR/IR states. The address input will select thedevice ACTAP for access if it was deselected or if the device ACTAP iscurrently selected, it will keep the device ACTAP selected. The statetransitions occur on the rising edge of TCK 1702. As seen the TDIcontrol bit 1704 and PRS signal 1706 are set high upon enteringPause-DR/IR, which initiates the address and command input and updateprocess. The ACTAP remains in the Pause-DR/IR state 3902 for the numberof CLK (TCK) inputs required to Shift in the address and command bitsfrom the TDI input and Update the command bus 3108. The falling edge3702 of the last CLK input sets the Enable output from FF 1417 high toenable the device ACTAP and the Update Register 3404 of Command Register3202. The rising edge 3704 of TCK provides the Update clock input to theUpdate Register 3404, via And gate 1305, to update the New Commandshifted into the ACTAP onto command bus 3108.

FIG. 39 illustrates an example of how the command bus 3108 of an Address& Command Circuit 3502 or 3602 could be used to control the selection ofone or more 1149.1 TAPs 4006-4012 in a device 4002 using a TAP LinkingCircuit 4004. In this example, the Address & Command Circuit 3102 inputsand updates an address and command in the Run Test/Idle, Pause-DR orPause-IR states as previously described. The TAP Linking Circuit 4004 iscoupled to the command bus 3108 and Enable signal outputs from Address &Command Circuit 3102, to the RST output of TAP State Monitor 902, to thedevices TDI, TCK, and TMS input leads, and to the devices TDO outputlead. The TAP Linking Circuit 4004 is also coupled to the TDI, TCK, TMS,TRST, and TDO signals of each 1149.1 TAP 4006-4012. In this example, TAP4006 is assumed to be the devices JTAG boundary scan TAP, TAP 4008 isassumed to be a TAP of a first embedded core in the device, TAP 4010 isassumed to be a TAP of a second embedded core in the device, and TAP4012 is assumed to a TAP of a third embedded core in the device. TheTAPs 4006-4012 could be used for any purpose, including but not limitedto test, debug, trace, and/or programming purposes.

FIG. 40 illustrates an example implementation of the TAP LinkingCircuitry 4004 of FIG. 39 interfaced to only two TAPs 4101-4103 forsimplification. As seen the TAP Linking Circuitry 4004 includes Andgates 4102-4104 and TDI/TDO Switching Circuitry 4106. And gate 4102inputs a Command Select TAP 1 signal from command bus 3108, the deviceTMS signal lead, the Enable signal, and outputs a TMS1 signal to TAP4101. And gate 4104 inputs a Command Select TAP 2 signal from commandbus 3108, the device TMS signal lead, the Enable signal from circuit3102, and outputs a TMS2 signal to TAP 4103. TDI/TDO Switch Circuitry4106 inputs the device TDI signal lead, Command Switch Control signalsfrom command bus 3108, a TDO1 signal from TAP 4101, a TDO2 signal fromTAP 4103, and outputs a TDI1 signal to TAP 4101 and a TDI2 signal to TAP4103. TAPs 4101 and 4103 are both coupled to the RST signal from TAPState Monitor 902 and to the devices TCK signal lead. And gates 4102 and4104 serve the same purpose as previously described for And gate 904,that is to gate on or off a connection between the devices TMS signallead, or the TMS signal lead from Adaptor 2902, and the TMS input ofTAPs 4101-4103. The gating on or off of And gates 4102 and 4104 iscontrolled by the Enable signal and by the Command Select TAP 1 and 2signals. The TDI/TDO Switching Circuitry 4106 is controlled by theCommand Switch Control signals to couple the devices TDI lead to the TAP4101 TDI 1 input or to the TAP 4103 TDI 2 input. The TDI/TDO SwitchingCircuitry 4106 is also controlled by the Command Switch Control signalsto couple the devices TDO output lead to the TAP 4101 TDO 1 output orthe TAP 4103 TDO 2 output. The TDI/TDO Switching Circuitry can becontrolled by the Command Switch Control signals to coupled only aselected one of the TAPs 4101-4103 to the devices TDI and TDO leads, orit can be controlled to link or couple both TAPs 4101-4103 in series,via their TDI and TDO leads, such that both TAPs 4101-4103 can beaccessed at the same time via the device TDI and TDO leads. If TAP 4101is selected it can be accessed via the devices TDI, TCK, TMS, and TDOleads, while TAP 4103 is deselected in the Test Logic Reset, RunTest/Idle, Pause-DR, or Pause-IR states. If TAP 4103 is selected it canbe accessed via the devices TDI, TCK, TMS, and TDO leads, while TAP 4101is deselected in the Test Logic Reset, Run Test/Idle, Pause-DR, orPause-IR states. If both TAP 4101 and 4103 are selected they can beaccessed in series via the devices TDI, TCK, TMS, and TDO leads. Atpower up or reset of the device, it is advantageous to pre-select thedevices 1149.1 JTAG boundary scan TAP 4006 of FIG. 39 to allow the JTAGTAP to be immediately accessible as required in the IEEE 1149.1standard. This can be achieved by simply defining the command output oncommand bus 3108 of Address & Command Circuit 3102 to default toselecting the JTAG TAP 4006 of FIG. 39 whenever the device powers up oris reset.

It should be understood that while the FIG. 9, FIG. 30, FIG. 34, FIG. 35and FIG. 40 embodiments of this disclosure have shown gating on and offthe TMS signal to select and deselect an 1149.1 TAP 910 using And gate904, the And gate 904 could have been similarly used to gate on and offthe TCK signal to select and deselect an 1149.1 TAP 910 if so desired.This is achieved by simply placing the And gate 904 in the TCK path toTAP 910 instead of in the TMS path to TAP 910 as shown in FIG. 41.

Although the disclosure has been described in detail, it should beunderstood that various changes, substitutions and alterations may bemade without departing from the spirit and scope of the disclosure asdefined by the appended claims.

What is claimed is:
 1. A process of operating an integrated circuithaving a Test Data In terminal, a Test Clock terminal, a Test ModeSelect terminal, and a state machine controlled by a Test Clock signalon the Test Clock terminal and a Test Mode Select signal on the TestMode Select terminal comprising: (a) entering a Test Logic Reset stateof the state machine in response to the Test Clock signal and the TestMode Select signal; (b) during a time that a Test Data In signal on theTest Data In terminal is in a first logic state: (i) moving the statemachine from a Test Logic Reset state to a Run/Test Idle state; and (ii)maintaining the state machine in the Run/Test Idle state; and (c) duringa time that the Test Data In signal is in a second logic state: (i)moving the state machine from the Test Logic Reset state to the Run/TestIdle state; (ii) while in the Run/Test Idle state, receiving Test DataIn signals that indicate address signals; and (iii) inputting theaddress signals to address circuitry in the integrated circuit.
 2. Theprocess of claim 1 in which the maintaining the state machine in theRun/Test Idle state includes not inputting the Test Data In signals tothe address circuitry.
 3. The process of claim 1 including moving thestate machine into a Select-DR state.
 4. The process of claim 1including moving the state machine into a Select-IR state.
 5. Theprocess of claim 1 including moving the state machine in to the TestLogic Reset state from a Select-IR state.
 6. A process of operating anintegrated circuit receiving a Test Data In signal, a Test Clock signal,and a Test Mode Select signal, and having a state machine controlled bythe Test Clock signal and the Test Mode Select signal comprising: (a)entering a Test Logic Reset state of the state machine in response tothe Test Clock signal and the Test Mode Select signal; (b) during a timethat a Test Data In signal is in a first logic state: (i) moving thestate machine from the Test Logic Reset state to a Run/Test Idle state;and (ii) maintaining the state machine in the Run/Test Idle state; and(c) during a time that the Test Data In signal is in a second logicstate: (i) moving the state machine from the Test Logic Reset state tothe Run/Test Idle state; (ii) while in the Run/Test Idle state,receiving Test Data In signals that indicate address signals; and (iii)inputting the address signals to address circuitry in the integratedcircuit.
 7. The process of claim 6 in which the maintaining the statemachine in the Run/Test Idle state includes not inputting the Test DataIn signals to the address circuitry.
 8. The process of claim 6 includingmoving the state machine from the Run/Test Idle state into a Select-DRstate.
 9. The process of claim 6 including moving the state machine intoa Select-IR state.
 10. The process of claim 6 including moving the statemachine in to the Test Logic Reset state from a Select-IR state.
 11. Aprocess of operating an integrated circuit having a Test Data Interminal, a Test Clock terminal, a Test Mode Select terminal, and astate machine controlled by a Test Clock signal on the Test Clockterminal and a Test Mode Select signal on the Test Mode Select terminalcomprising: (a) entering a Test Logic Reset state of the state machinein response to the Test Clock signal and the Test Mode Select signal;(b) moving the state machine from the Test Logic Reset state to aRun/Test Idle state during a time that a Test Data In signal on the TestData In terminal is in a first logic state, and maintaining the statemachine in the Run/Test Idle state; and (c) moving the state machinefrom the Test Logic Reset state to the Run/Test Idle state during a timethat the Test Data In signal is in a second logic state, and while inthe Run/Test Idle state, receiving Test Data In signals that indicateaddress signals, and inputting the address signals to address circuitryin the integrated circuit.
 12. The process of claim 11 in which themaintaining the state machine in the Run/Test Idle state includes notinputting the Test Data In signals to the address circuitry.
 13. Theprocess of claim 11 including moving the state machine into a Select-DRstate.
 14. The process of claim 11 including moving the state machineinto a Select-IR state.
 15. The process of claim 11 including moving thestate machine in to the Test Logic Reset state from a Select-IR state.